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Orientation Adjustment of Microscale Particles for Quantitative SEM-EDS Analysis

Published online by Cambridge University Press:  30 July 2021

Chunfei Li ,
Alexander Huey ,
Jeremy Marshall  and
Coleman Milligan
Chunfei Li
Affiliation:
Clarion University, Clarion, Pennsylvania, United States
Alexander Huey
Affiliation:
California University of Pennsylvania, United States
Jeremy Marshall
Affiliation:
Clarion University, Clarion, Pennsylvania, United States
Coleman Milligan
Affiliation:
Clarion University, Clarion, Pennsylvania, United States

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1666 - 1668
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Stevens, K. A. (1983). Surface Tilt(the direction of slant): A Neglected Psychophysical Variable (Master's thesis, Massachusetts Institute of Technology, 1983), Cambridge.Google Scholar
Duley, Niespodzianski, Merando, J. Marshall, and C. Li, EDS Analysis of Icosahedral Quasicrystalline Thin Film in Al65Cu25Fe15 Alloy Prepared by Arc-melting. Microscopy and Microanalysis, 1-3 (2020). doi:10.1017/S1431927620020735.Google Scholar