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Organic Polymer Solar Cell Morphology Characterization with AFM, TEM and Helium Ion Microscopy (HIM)

Published online by Cambridge University Press:  01 August 2010

E van Veldhoven ,
H van der Veer ,
D Maas ,
P Graat ,
MA Verheijen ,
Y Galagan  and
R Andriessen
E van Veldhoven
Affiliation:
The Netherlands Organization for Applied Scientific Research, The Netherlands
H van der Veer
Affiliation:
The Netherlands Organization for Applied Scientific Research, The Netherlands
D Maas
Affiliation:
The Netherlands Organization for Applied Scientific Research, The Netherlands
P Graat
Affiliation:
Philips Research, The Netherlands
MA Verheijen
Affiliation:
Philips Research, The Netherlands
Y Galagan
Affiliation:
Holst Center, The Netherlands
R Andriessen
Affiliation:
Holst Center, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1380 - 1381
Copyright
Copyright © Microscopy Society of America 2010