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Optimizing the Recognition of Surface Crystallography

Published online by Cambridge University Press:  28 September 2015

Ludψk Frank ,
Filip Mika  and
Ilona Müllerová
Ludψk Frank
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
Filip Mika
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic
Ilona Müllerová
Affiliation:
Institute of Scientific Instruments of the ASCR, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic

Abstract

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Type
Surface Physics Instrumentation
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 124 - 129
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1]Venables, JA & Harland, CJ, Phil. Mag 27 (1973). p 1193.CrossRefGoogle Scholar
[2]Müllerová, I & Frank, L, Adv. Imaging and Electron Phys 128 (2003), p 309.CrossRefGoogle Scholar
[3]Kieft, E & Bosch, E, J. Phys. D - Appl. Phys 41 (2008). no. 215310.CrossRefGoogle Scholar
[4]Reimer, L in “Scanning electron microscopy, physics of image formation and microanalysis“, (Springer, Berlin) Chapt. 9.Google Scholar
[5] Study supported by the project TE01020118 of the TACR and by MEYS CR (LO1212). Thanks are due to Mr. Jiff Sykora for his assistance in experiments.Google Scholar