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Optimization of STEM Moiré analysis for Two-Dimensional Strain Characterization
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Diffraction Imaging Across Disciplines
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Ishizuka, Akimitsu, Hytch, Martin, Ishizuka, Kazuo, “STEM moiré analysis for 2D strain measurements”, Microscopy, Volume 66, Issue 3, June 2017, Pages 217–221CrossRefGoogle ScholarPubMed
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