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Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM

Published online by Cambridge University Press:  27 August 2014

Pavel Čudek ,
Josef Jirák  and
Vilém Neděla
Pavel Čudek
Affiliation:
Department of Electrotechnology, Brno University of Technology, Brno, Czech Republic
Josef Jirák
Affiliation:
Department of Electrotechnology, Brno University of Technology, Brno, Czech Republic Institute of Scientific Instruments of ASCR, Brno, Czech Republic
Vilém Neděla
Affiliation:
Institute of Scientific Instruments of ASCR, Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 40 - 41
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Jirák, J, et al Journal of Microscopy 239 (2010),p. 233.Google Scholar
[2] Jirák, J, et al Microscopy and Microanalysis (2012)p. 1266.Google Scholar
[3] Jirák, J, et al Microscopy and Microanalysis (2011)p. 922.Google Scholar
[4] This work was supported by the EU project No. CZ.1.07/2.3.00/20.0103 and by the Grant Agency of the Czech Republic: grant No. GA 14-22777S.Google Scholar