Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T08:31:54.365Z Has data issue: false hasContentIssue false
  • English
  • Français

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup

Published online by Cambridge University Press:  23 September 2015

Julien Guyon ,
Nathalie Gey ,
Daniel Goran ,
Smail Chalal  and
Fabian Perez-Willard
Julien Guyon
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux, LEM3, CNRS ISGMP, Universite de Lorraine, F-57045 Metz Cedex 01, France Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Universite de Lorraine, France
Nathalie Gey
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux, LEM3, CNRS ISGMP, Universite de Lorraine, F-57045 Metz Cedex 01, France Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Universite de Lorraine, France
Daniel Goran
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
Smail Chalal
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen, Germany
Fabian Perez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2035 - 2036
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Uchic, M., et al, 1st International Conference on 3D Materials Science (2012) p. 195-202.Google Scholar
[2] Echlin, M. P., et al, Acta Mater 64 (2014). p. 307–315.CrossRefGoogle Scholar
[3] Zaefferer, S. & Wright, S. I. in Electron Backscatter Diffraction in Materials Science (ed A. J. Schwartz et al (Springer (2009), p. 109–122.CrossRefGoogle Scholar
[4] Donitz, D. & Wagner, Ch. US Patent US8901510 B2 (2014).Google Scholar
[5] Groeber, M. A. & Jackson, M. A., Integr. Mater. Manuf. Innov (2014) 3, 5.CrossRefGoogle Scholar