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Optimal Electron Beam Sensitivity Determinations Using Live Time Low Dose Imaging of Vitreous Ice and Lens Coupled CCDs

Published online by Cambridge University Press:  18 July 2003

J.F. Mancuso ,
Y.M. Heng  and
C.A. Ackerley
J.F. Mancuso
Affiliation:
Advanced Microscopy Techniques Corp., 3 Electronics Ave, Danvers, MA 01923
Y.M. Heng
Affiliation:
Division of Pathology, Hospital for Sick Children, Toronto, ON
C.A. Ackerley
Affiliation:
Division of Pathology, Hospital for Sick Children, Toronto, ON

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1370 - 1371
Copyright
Copyright © Microscopy Society of America 2003