Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T06:34:35.247Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscope: A Comprehensive In Situ Characterization Platform

Published online by Cambridge University Press:  27 August 2014

Matthieu Picher ,
Stefano Mazzucco ,
Steve Blankenship ,
Glenn Holland  and
Renu Sharma
Matthieu Picher
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203 Institute for Research in Electronics and Applied Physics, University of Maryland, College park, MD 20740
Stefano Mazzucco
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Steve Blankenship
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Glenn Holland
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Renu Sharma
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1748 - 1749
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Sharma, R., Mat., J. Res. (2005). 20, 1695.Google Scholar
[2] Hansen, , et al., Science (2001). 294, 1508.Google Scholar