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Optical Sectioning with Atomic Resolution Spectroscopy

Published online by Cambridge University Press:  27 August 2014

Timothy J. Pennycook
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Mariona Cabero
Affiliation:
Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain
Alberto Ribera-Calzada
Affiliation:
Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain
Carlos Leon
Affiliation:
Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain
Maria Varela
Affiliation:
Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Jacobo Santamaria
Affiliation:
Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK SuperSTEM Laboratory, Daresbury, WA4 4AD, UK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Behan, G., et al, Phil. Trans. R. Soc. A 367 (2009), p. 3825.Google Scholar
[2] This research was supported in part by the EPSRC through the UK National Facility for Aberration-Corrected STEM (SuperSTEM). Research at Oak Ridge National Laboratory was sponsored by the US Department of Energy, Office of Science, Materials Sciences and Engineering Division. Research at Complutense sponsored by the European Research Council Starting Investigator Award STEMOX.Google Scholar