Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T04:19:30.660Z Has data issue: false hasContentIssue false
  • English
  • Français

Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors

Published online by Cambridge University Press:  23 September 2015

Lewys Jones ,
Hao Yang ,
Katherine E. MacArthur ,
Henning Ryll ,
Martin Simson ,
Heike Soltau ,
Yukihito Kondo ,
Ryusuke Sagawa ,
Hiroyuki Banba  and
Peter D. Nellist
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Hao Yang
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Katherine E. MacArthur
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Henning Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Yukihito Kondo
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Ryusuke Sagawa
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Hiroyuki Banba
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2411 - 2412
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Pennycook, T. J., et al, Ultramicroscopy in-press 2014.Google Scholar
[2] Hillyard, S. & Silcox, J., Ultramicroscopy 58 (1995). p. 6–17.Google Scholar
[3] Zhu, G., et al., Appl. Phys. Lett. 105 (2014). p. 231607.CrossRefGoogle Scholar
[4] Lebeau, J. M. & Stemmer, S., Ultramicroscopy 108 (2008). p. 1653–1658.CrossRefGoogle Scholar
[5] This work was supported by the EU grant 312483 - ESTEEM2 and EPSRC grant EP/K040375/. 1. The authors thank Johnson Matthey for the PtCo sample and for financially supporting KEM.Google Scholar