Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-26T00:43:03.518Z Has data issue: false hasContentIssue false
  • English
  • Français

Operando and in situ in a TEM imaging in a cryogenic temperature range

Published online by Cambridge University Press:  30 July 2021

Martial Duchamp ,
Joseph Vas ,
Reinis Ignatans ,
Aaron David Mueller ,
Rohit Medwal ,
Rajdeep Rawat  and
Vasiliki Tileli
Martial Duchamp
Affiliation:
Nanyang Technological University (NTU), United States
Joseph Vas
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Reinis Ignatans
Affiliation:
Institute of Materials, École Polytechnique Fédérale de Lausanne, United States
Aaron David Mueller
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Rohit Medwal
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Rajdeep Rawat
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Vasiliki Tileli
Affiliation:
Institute of Materials, École polytechnique fédérale de Lausanne, Lausanne, Switzerland

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 386 - 387
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Duchamp, M.; Xu, Q.; Dunin-Borkowski, R. E. Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope. Microscopy and Microanalysis. 2014, 20 (06), 1638–1645.CrossRefGoogle ScholarPubMed
Jeangros, Q.; Duchamp, M.; Werner, J.; Kruth, M.; Dunin-Borkowski, R. E.; Niesen, B.; Ballif, C.; Hessler-Wyser, A. In Situ TEM Analysis of Organic–Inorganic Metal-Halide Perovskite Solar Cells under Electrical Bias. Nano Letters. 2016, 16 (11), 7013–7018.CrossRefGoogle ScholarPubMed
Tyukalova, E.; Duchamp, M. Atomic Resolution Enabled STEM Imaging of Nanocrystals at Cryogenic Temperature. J. Phys. Mater. 2020, 3 (3), 034006.CrossRefGoogle Scholar
Ignatans, R.; Damjanovic, D.; Tileli, V. Local Hard and Soft Pinning of 180° Domain Walls in BaTiO3 Probed by in Situ Transmission Electron Microscopy. Phys. Rev. Materials. 2020, 4 (10), 104403.CrossRefGoogle Scholar
Ignatans, R.; Damjanovic, D.; Tileli, V. Local Hard and Soft Pinning of 180° Domain Walls in BaTiO3 Probed by in Situ Transmission Electron Microscopy. Phys. Rev. Materials. 2020, 4 (10), 104403.CrossRefGoogle Scholar
Medwal, R.; Chaudhuri, U.; Vas, J. V.; Deka, A.; Gupta, S.; Duchamp, M.; Asada, H.; Fukuma, Y.; Mahendiran, R.; Rawat, R. S. Magnetoimpedance of Epitaxial Y 3 Fe 5 O 12 (001) Thin Film in Low-Frequency Regime. ACS Appl. Mater. Interfaces. 2020, 12 (37), 41802–41809.CrossRefGoogle Scholar