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On-Axis Electrode Aberration Correctors for Scanning Electron/Ion Microscopes

Published online by Cambridge University Press:  28 September 2015

A. Khursheed  and
W. K. Ang

Abstract

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Type
Aberration Studies
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 106 - 111
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1]Lenz, F & Wilska, AP, Optik 24 (1966/67). p. 383.Google Scholar
[2]Slätis, H & Siegbahn, K, Ark. Fysik 1 (1949). p. 339.Google Scholar
[3] LORENTZ-2EM, Integrated Engineering Software Inc., Canada..Google Scholar
[4]Ward, BW, Notte, JA & Economou, NP, J. Vac. Sci. Technol. B 24 (2006). p. 2871.CrossRefGoogle Scholar
[5]Spence, JCH in High-Resolution Electron Microscopy. Oxford University Press. p. 80.Google Scholar
[6] US patent application, U.S. Serial No. 62/041,208..Google Scholar