On the Performance of XEDS and EELS in the AEM: 25 Years Later

H Fraser; D Klenov; Y-C Wang; H Cheng; N Zaluzec

doi:10.1017/S1431927611003825

On the Performance of XEDS and EELS in the AEM: 25 Years Later

Published online by Cambridge University Press: 08 April 2017

H Fraser ,

D Klenov ,

Y-C Wang ,

H Cheng and

N Zaluzec

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H Fraser: Affiliation:
The Ohio State University
D Klenov: Affiliation:
FEI-Eindhoven
Y-C Wang: Affiliation:
FEI-Hillsboro
H Cheng: Affiliation:
FEI-Hillsboro
N Zaluzec: Affiliation:
Argonne National Laboratory

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 590 - 591

DOI: https://doi.org/10.1017/S1431927611003825 [Opens in a new window]

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On the Performance of XEDS and EELS in the AEM: 25 Years Later

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