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On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

Published online by Cambridge University Press:  05 April 2018

Sergey Y. Luchkin  and
Keith J. Stevenson
Sergey Y. Luchkin*
Affiliation:
Skolkovo Institute of Science and Technology, Nobel St. 3, Moscow 143026, Russian Federation
Keith J. Stevenson
Affiliation:
Skolkovo Institute of Science and Technology, Nobel St. 3, Moscow 143026, Russian Federation
*
*Author for correspondence: Sergey Y. Luchkin, E-mail: [email protected]
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Abstract

In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

Keywords

AFMKPFMelectrostatic forcetip geometryresolution
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 24 , Issue 2 , April 2018 , pp. 126 - 131
Copyright
© Microscopy Society of America 2018 

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