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On the Influence of Specimen Thickness in TEM Images of Super-Conducting Vortices: II

Published online by Cambridge University Press:  02 July 2020

J. Bonevich ,
D. Capacci ,
R. Patti ,
G. Pozzi ,
K. Harada ,
H. Kasai ,
T. Matsuda  and
A. Tonomura
J. Bonevich
Affiliation:
National Institute of Standards & Technology, Metallurgy Division, Gaithersburg, MD20899USA
D. Capacci
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
R. Patti
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
G. Pozzi
Affiliation:
Physics Dept. & Istituto Nazionale di Fisica per la Materia, viale B. Pichat 6/2, 40127Bologna, Italy
K. Harada
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
H. Kasai
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
T. Matsuda
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
A. Tonomura
Affiliation:
Advanced Research Laboratory, Hitachi Ltd., Hatoyama-machi, Saitama-ken 350-03, Japan
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Extract

In our previous papers on the same topic we have shown how the finite thickness of the specimen influences the magnetic field distribution associated to a single superconducting vortex. Fortunately, Clem found an approximate, but analytical, solution for this problem predicting that the field lines are bent within the specimen and fan out near the surfaces, giving an external field topography broader than the bulk one. This is shown in Figure 1 (a) which reports the projected phase maps of the magnetic field, i.e., the phase shift experienced by a coherent electron plane wave in an ideal experiment where the beam direction is parallel to the specimen surface and the apparent infinite thickness of the specimen is overlooked. The specimen thickness has been taken equal to 2 λL, the bulk London penetration depth. Figure 1 (b) shows the trends of the z-component of the magnetic field calculated up to a distance from the core of 5 λL at the film surface (lower curve), at the film center (intermediate curve) and, for reference, the bulk Clem model (upper curve).

Type
Recent Developments in Microscopy for Studying Electronic and Magnetic Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 505 - 506
Copyright
Copyright © Microscopy Society of America 1997

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References

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