Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T15:12:00.477Z Has data issue: false hasContentIssue false
  • English
  • Français

On the Benefits of Obtaining Surface Topography and Volume Structure Information by Correlative S(T)EM in a Scanning Electron Microscope

Published online by Cambridge University Press:  07 February 2019

Cheng Sun ,
Erich Müller  and
Dagmar Gerthsen
Cheng Sun
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.
Erich Müller
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.
Dagmar Gerthsen
Affiliation:
Laboratory for Electron Microscopy (LEM), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Materials Science (Posters)
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 73 - 74
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Inada, H et al. , Ultramicroscopy 111 (2011), p. 865.Google Scholar
[2]We thank Dr Maria Casapu, Andreas Gremminger, Prof Dirk Grunwaldt (Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute for Technology (KIT)) for providing the Pt/Al2O3 sample.Google Scholar
[3]The authors acknowledge funding from the DFG (Deutsche Forschungsgemeinschaft).Google Scholar