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Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM

Published online by Cambridge University Press:  27 August 2014

B.J. Griffin ,
D.C. Joy  and
J.R. Michael
B.J. Griffin
Affiliation:
Centre for Forensic Science, The University of Western Australia, Crawley, WA Australia 6009 Centre for Microscopy, Characterization and Analysis, The University of Western Australia, Crawley, WA Australia 6009
D.C. Joy
Affiliation:
Center for NanoPhase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831
J.R. Michael
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-0886

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 14 - 15
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Images in figures 1-4 are courtesy of TESCAN ORSAY.Google Scholar
[2] Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy (DOE) under contract DE-AC0494AL85000.Google Scholar