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Oliver C. Wells' Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution

Published online by Cambridge University Press:  27 August 2014

Michael T. Postek ,
Andras E. Vladar  and
Bin Ming
Michael T. Postek
Affiliation:
National Institute of Standards and Technology, Physical Measurement Laboratory, Gaithersburg, MD 20899 [1]
Andras E. Vladar
Affiliation:
National Institute of Standards and Technology, Physical Measurement Laboratory, Gaithersburg, MD 20899 [1]
Bin Ming
Affiliation:
National Institute of Standards and Technology, Physical Measurement Laboratory, Gaithersburg, MD 20899 [1]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 4 - 5
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Contribution of the National Institute of Standards and Technology; not subject to copyright.Google Scholar
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[7] Postek, M., et al. SCANNING 23(5) (2001), p. 298-304.Google Scholar
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