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Observation of the Potential Distribution in GaN-Based Devices by a Scanning Electron Microscope

Published online by Cambridge University Press:  23 September 2015

T. Karumi  and
S. Tanaka
T. Karumi
Affiliation:
Dept. Electrical Eng., Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
S. Tanaka
Affiliation:
EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 275 - 276
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[7] We thank Professor H. Amano (Nagoya University) for providing the samples.Google Scholar