Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T09:21:45.522Z Has data issue: false hasContentIssue false
  • English
  • Français

Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

Christopher R Perrey ,
Julia M Deneen ,
Siri S Thompson ,
Markus Lentzen ,
Uwe Kortshagen  and
C. Barry Carter
Christopher R Perrey
Affiliation:
University of Minnesota
Julia M Deneen
Affiliation:
University of Minnesota
Siri S Thompson
Affiliation:
University of Minnesota
Markus Lentzen
Affiliation:
Institute for Solid State Research Jülich, Germany
Uwe Kortshagen
Affiliation:
University of Minnesota
C. Barry Carter
Affiliation:
University of Minnesota
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 996 - 997
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)