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Objective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Lattice Metric

Published online by Cambridge University Press:  22 July 2022

Peter Moeck  and
Lukas von Koch
Peter Moeck*
Affiliation:
Department of Physics, Portland State University, Portland, Oregon, USA
Lukas von Koch
Affiliation:
Department of Physics, Portland State University, Portland, Oregon, USA Westside Christian High School, Portland, Oregon, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2496 - 2499
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Copyright
Copyright © Microscopy Society of America 2022

References

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Moeck, P and von Koch, L, arXiv: 2201.04789, 4 pages, Jan.-Feb. 2022.Google Scholar
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Our numerical results were calculated from *.hke files by programs that the second author of this paper, Lukas von Koch, wrote. This work was supported by a Faculty Enhancement Grant from Portland State University to the first (and corresponding) author.Google Scholar