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A Novel Way for Determining Bravais Lattice Using a Single Electron Backscatter Diffraction Pattern

Published online by Cambridge University Press:  23 September 2015

Lili Li  and
Ming Han
Lili Li
Affiliation:
School of Materials Science and Engineering, Fujian University of Technology, Fuzhou, 350118, China
Ming Han
Affiliation:
School of Materials Science and Engineering, Fujian University of Technology, Fuzhou, 350118, China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2375 - 2376
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Dingley, D & Wright, S, J. Appl. Cryst. 42 (2009). p. 234–241.Google Scholar
[2] Baba-kishi, K, Scanning 20 (1998). p. 117–127.CrossRefGoogle Scholar