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Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.

Published online by Cambridge University Press:  05 August 2019

Chris Meyer ,
Niklas Dellby ,
Jordan A. Hachtel ,
Tracy Lovejoy ,
Andreas Mittelberger  and
Ondrej Krivanek
Chris Meyer*
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Niklas Dellby
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA
Tracy Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Andreas Mittelberger
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Ondrej Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, AZ 85287, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 122 - 123
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Meyer, C.E. et al. , Microsc. Microanal. 20 (Suppl 3, 2014) 1108-1109.Google Scholar
[2]Pennington, R.S., Wang, F. and Koch, C.T., Ultramicroscopy 141 (2014) 32-37.Google Scholar
[3]http://nion.com/swiftGoogle Scholar