Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-27T08:50:27.126Z Has data issue: false hasContentIssue false
  • English
  • Français

Ni(111) Thin Layers Recrystallization Studied by SEM, EBSD and AFM

Published online by Cambridge University Press:  05 August 2019

Dominika Teklinska ,
Iwona Jozwik  and
Piotr Knyps
Dominika Teklinska
Affiliation:
Institute of Electronic Materials Technology, Warsaw, Poland
Iwona Jozwik
Affiliation:
Institute of Electronic Materials Technology, Warsaw, Poland National Centre for Nuclear Research, NOMATEN Centre of Excellence, Swierk-Otwock, Poland
Piotr Knyps
Affiliation:
Institute of Electronic Materials Technology, Warsaw, Poland

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1982 - 1983
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Khan, M H et al. , Materials Today 20 (2017), p. 611.Google Scholar
[2]Sundaram, S et al. , J. Cryst. Growth 509 (2019), p. 40.Google Scholar
[3]Wang, J et al. , Materials Today Physics 2 (2017), p.6.Google Scholar
[4]This work was partially sponsored by The Polish Ministry of Science and Higher Education, in the frame of the research project entitled „Recrystallization of nickel layers on the sapphire substrates” held at the Institute of Electronic Materials Technology, Warsaw, Poland.Google Scholar