Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Ophus, Colin
2019.
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond.
Microscopy and Microanalysis,
Vol. 25,
Issue. 3,
p.
563.
Wang, Binbin
Esser, Bryan D.
Bagués, Núria
Williams, Robert E. A.
Yan, Jiaqiang
and
McComb, David W.
2019.
Quantifying Jahn-Teller distortion at the nanoscale with picometer accuracy using position averaged convergent beam electron diffraction.
Physical Review Research,
Vol. 1,
Issue. 3,
Ciston, Jim
Johnson, Ian J.
Draney, Brent R.
Ercius, Peter
Fong, Erin
Goldschmidt, Azriel
Joseph, John M.
Lee, Jason R.
Mueller, Alexander
Ophus, Colin
Selvarajan, Ashwin
Skinner, David E.
Stezelberger, Thorsten
Tindall, Craig S.
Minor, Andrew M.
and
Denes, Peter
2019.
The 4D Camera: Very High Speed Electron Counting for 4D-STEM.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
1930.
Deng, Yu
Zhang, Ruopeng
Pekin, Thomas C.
Gammer, Christoph
Ciston, Jim
Ercius, Peter
Ophus, Colin
Bustillo, Karen
Song, Chengyu
Zhao, Shiteng
Guo, Hua
Zhao, Yunlei
Dong, Hongliang
Chen, Zhiqiang
and
Minor, Andrew M.
2020.
Functional Materials Under Stress: In Situ TEM Observations of Structural Evolution.
Advanced Materials,
Vol. 32,
Issue. 27,
2022.
Principles of Electron Optics, Volume 3.
p.
1869.
Zambon, P.
Bottinelli, S.
Schnyder, R.
Musarra, D.
Boye, D.
Dudina, A.
Lehmann, N.
De Carlo, S.
Rissi, M.
Schulze-Briese, C.
Meffert, M.
Campanini, M.
Erni, R.
and
Piazza, L.
2023.
KITE: High frame rate, high count rate pixelated electron counting ASIC for 4D STEM applications featuring high-Z sensor.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,
Vol. 1048,
Issue. ,
p.
167888.