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News on Silicon Drift Detectors for X-Ray Nanoanalysis in S/TEM

Published online by Cambridge University Press:  01 August 2010

M Falke ,
R Kroemer ,
D Fissler  and
M Rohde
M Falke
Affiliation:
Bruker-AXS Microanalysis GmbH
R Kroemer
Affiliation:
Bruker-AXS Microanalysis GmbH
D Fissler
Affiliation:
Bruker-AXS Microanalysis GmbH
M Rohde
Affiliation:
Bruker-AXS Microanalysis GmbH

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 2 - 3
Copyright
Copyright © Microscopy Society of America 2010