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The New X-ray Mapping: Applying the Silicon Drift Detector (SDD) for X-ray Spectrometry and Spectrum Imaging with Output Count Rates above 100 kHz

Published online by Cambridge University Press:  01 August 2005

D E Newbury
D E Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1328 - 1329
Copyright
© 2005 Microscopy Society of America