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New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction

Published online by Cambridge University Press:  27 August 2014

Travis M. Rampton ,
Matthew M. Nowell  and
Stuart I. Wright
Travis M. Rampton
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Mahwah, NJUSA
Matthew M. Nowell
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper, UTUSA
Stuart I. Wright
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper, UTUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1482 - 1483
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Yoda, R, Yokomaku, T, Tsuji, N Materials Characterization 61 (2010), p.913-922.Google Scholar
[2] Wright, S, Nowell, M, Field, D Microsc. Microanal. 17 (2011), p. 316-329.Google Scholar