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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction

Published online by Cambridge University Press:  23 September 2015

Matthew M. Nowell ,
Stuart I. Wright ,
Travis Rampton ,
Ryan J. Stromberg ,
Sanjit Bhowmich ,
Masateru Shibata  and
Natasha Erdman
Matthew M. Nowell
Affiliation:
EDAX Inc., Draper, UT, USA
Stuart I. Wright
Affiliation:
EDAX Inc., Draper, UT, USA
Travis Rampton
Affiliation:
EDAX Inc., Mahwah, NJ, USA
Ryan J. Stromberg
Affiliation:
Hysitron Inc., Minneapolis, MN, USA
Sanjit Bhowmich
Affiliation:
Hysitron Inc., Minneapolis, MN, USA
Masateru Shibata
Affiliation:
JEOL USA Inc., Peabody, MA, USA
Natasha Erdman
Affiliation:
JEOL USA Inc., Peabody, MA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1173 - 1174
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Wright, S., et al, Ultramicroscopy 148 (2015), p 132.CrossRefGoogle Scholar
[2] Wright, S., Nowell, M. & Field, D., Microscopy and Microanalysis 17 (2011), p 316.CrossRefGoogle Scholar
[3] Fizanne-Michel, C., et al, Materials Science and Engineering A 613 (2014), p 159.CrossRefGoogle Scholar