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New Quantitative Phase Reconstruction Technique using Hollow-cone Probe and Annularly Arrayed Detectors in STEM

Published online by Cambridge University Press:  23 September 2015

Takafumi Ishida ,
Tadahiro Kawasaki ,
Takayoshi Tanji  and
Takashi Ikuta
Takafumi Ishida
Affiliation:
Department of Electrical Engineering and Computer Science, Nagoya University, Nagoya 464-8603 Japan
Tadahiro Kawasaki
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya 464-8603 Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587 Japan Global Research Center for Environment and Energy based on Nanomaterials Science, Nagoya, 464-8603 Japan
Takayoshi Tanji
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya 464-8603 Japan Global Research Center for Environment and Energy based on Nanomaterials Science, Nagoya, 464-8603 Japan
Takashi Ikuta
Affiliation:
Department of Electrical and Electronic Engineering, Osaka Electro-Communication University,Neyagawa 572-8530 Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1973 - 1974
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Taya, M., et al., Rev. Sci. Instrum. 78 (2007). p 083705.Google Scholar
[3] Ishida, T., et al., Microscopy (in press 10.1093/jmicro/dfu098.Google Scholar
[4] Ishida, T., et al., Microscopy (in press 10.1093/jmicro/dfu113.Google Scholar
[5] Lichite, H., et al., Annu. Rev. Mater. Res. 37 (2007). p 539.Google Scholar
[6] This work was supported by JSPS KAKENHI Grant Numbers 18GS0211 and 24360020, and in part by the program "Global Research Center for Environment and Energy based on Nanomaterials Science" of MEXT, Japan..Google Scholar