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New Method of Preparing Cross Sectional Samples and Ultra-Thin Foils for SEM and TEM by a Broad Argon Ion Beam

Published online by Cambridge University Press:  31 July 2006

K Ogura ,
N Erdman ,
AR Campbell  and
S Asahina
K Ogura
Affiliation:
JEOL Ltd.
N Erdman
Affiliation:
JEOL USA,Inc.
AR Campbell
Affiliation:
JEOL USA,Inc.
S Asahina
Affiliation:
JEOL Ltd.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1246 - 1247
Copyright
© 2006 Microscopy Society of America