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New Insights in Materials Characterization – Spectral Computed Tomography

Published online by Cambridge University Press:  22 July 2022

Wesley De Boever*
Affiliation:
TESCAN, Belgium
Denis Van Loo
Affiliation:
TESCAN, Belgium
Marek Dosbaba
Affiliation:
TESCAN, Belgium
Marijn Boone
Affiliation:
TESCAN, Belgium
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Copyright
Copyright © Microscopy Society of America 2022