Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-30T00:00:17.430Z Has data issue: false hasContentIssue false
  • English
  • Français

A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

Published online by Cambridge University Press:  27 August 2014

John J. Donovan  and
John T. Armstrong
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, 97403
John T. Armstrong
Affiliation:
Carnegie Institution for Science, Geophysical Lab, Washington, DC, NW, 20015-1305

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 724 - 725
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Donovan, JJ, Lowers, HA, Rusk, BG (2011) Improved Electron Probe Microanalysis of Trace Elements in Quartz, American Mineralogist, 96, 274-282.Google Scholar
[2] Allaz, J, Williams, ML, Jercinovic, MJ, and Donovan, JJ (in preparation) Multipoint Background Method: Gaining precision and accuracy in electron microprobe trace element analysis. To be submitted to Chemical Geology.Google Scholar
[3] Armstrong, JT (1988) Quantitative Analysis of Silicate and Oxide Materials: Comparison of Monte Carlo, ZAF, and Procedures, Microbeam Analysis, 239-246.Google Scholar
[4] Donovan, JJand Tingle, T (1996), An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis, Jour. of Micros. Microa., 1-7.Google Scholar