A New Automated Method for Fast and Reliable Tilt-Series Acquisition in Electron Tomography

C. Kübel; W.F. Voorhout; A.G. van Balen; D. Hubert; M.T. Otten

doi:10.1017/S1431927602105630

A New Automated Method for Fast and Reliable Tilt-Series Acquisition in Electron Tomography

Published online by Cambridge University Press: 01 August 2002

C. Kübel ,

D. Hubert and

C. Kübel: Affiliation:
FEI Company, Application Laboratory, P.O. Box 80066, 5600 KA Eindhoven, The Netherlands

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 792 - 793

DOI: https://doi.org/10.1017/S1431927602105630 [Opens in a new window]

Article contents

A New Automated Method for Fast and Reliable Tilt-Series Acquisition in Electron Tomography

Abstract

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