Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T18:38:01.734Z Has data issue: false hasContentIssue false
  • English
  • Français

New Approaches to Determine K Line Ratios of Pure Elements

Published online by Cambridge University Press:  01 August 2018

Ralf Terborg ,
Falk Reinhardt ,
Fabian Nitsche  and
Timo Wolff
Ralf Terborg
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany
Falk Reinhardt
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany
Fabian Nitsche
Affiliation:
Bruker AXS GmbH, Östliche Rheinbrückenstraße 49, 76187Karlsruhe, Germany
Timo Wolff
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489Berlin, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 774 - 775
Copyright
© Microscopy Society of America 2018 

References

[1] Scofield, J.H. Phys. Rev. A 9 1974) p. 1041.Google Scholar
[2] Salem, S. I., Panossian, S. L. Krause, R. A. Atom. Data Nucl. Data 14 1974 91.Google Scholar
[3] Ertuğral, B., Apaydin, G., Ҫevik, U., Ertuğrul, M. Kobya, A. Radiat. Phys.Chem 76 2007 15.Google Scholar
[4] Elam, W. T., Ravel, B. D. Sieber, J. R. Radiat. Phys.Chem 63 2002 121.Google Scholar
[5] Möser, B. Cryst. Res. Technol 20 1985) p. 1503.Google Scholar