Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-12-03T00:40:34.392Z Has data issue: false hasContentIssue false
  • English
  • Français

New Approach for High Quality Cross Sectioning in Tablets using Broad Argon Ion Beam with LN2 Sample Cooling

Published online by Cambridge University Press:  01 August 2018

Rintaro Kawano ,
Yuji Hasebe ,
Yuuki Yamaguchi ,
Noriyoshi Manabe ,
Natasha Erdman  and
Shunsuke Asahina
Rintaro Kawano
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Yuji Hasebe
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Yuuki Yamaguchi
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan
Noriyoshi Manabe
Affiliation:
Pharmaceutical Physical Chemistry, Tohoku Medical and Pharmaceutical University, Sendai, Japan
Natasha Erdman
Affiliation:
JEOL USA, Inc. Peabody, MA, USA
Shunsuke Asahina
Affiliation:
SM Business Unit, JEOL Ltd., Akishima, Tokyo, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1424 - 1425
Copyright
© Microscopy Society of America 2018 

References

[1] Taraini, D., et al, Microscopy and Analysis 22 2008) p. 13.Google Scholar
[2] Kuriyama, A., et al, AAPS PharmSciTech 15 2014) p. 375.Google Scholar
[3] Ho, L., et al, Journal of Controlled release 127 2008) p. 79.Google Scholar
[4] Fu, Y., et al, Journal of Controlled release 109 2005) p. 203.Google Scholar
[5] Asahina, S., et al, APL Materials 2 2014) p. 113317.Google Scholar