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Neutron Dark Field Tomography of Hierarchical Structures

Published online by Cambridge University Press:  22 July 2022

J.M. LaManna ,
D.S. Hussey ,
C.M. Wolf ,
Y. Kim ,
S.M. Robinson ,
M.C. Daugherty ,
R.P. Murphy ,
P.A. Kienzle ,
N.N. Klimov  and
M.G. Huber
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J.M. LaManna
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
D.S. Hussey*
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
C.M. Wolf
Affiliation:
Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD, USA
Y. Kim
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA Department of Chemistry & Biochemistry, University of Maryland, College Park, MD, USA
S.M. Robinson
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
M.C. Daugherty
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA Department of Chemical & Biomolecular Engineering, University of Maryland, College Park, MD, USA
R.P. Murphy
Affiliation:
Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD, USA
P.A. Kienzle
Affiliation:
Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD, USA
N.N. Klimov
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
M.G. Huber
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
P.N. Bajcsy
Affiliation:
Information Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
D.L. Jacobson
Affiliation:
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
K.M. Weigandt
Affiliation:
Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 280
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Copyright
Copyright © Microscopy Society of America 2022