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Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Published online by Cambridge University Press:  27 August 2014

Steffi Rades ,
Tobias Salge ,
Roland Schmidt  and
Vasile-Dan Hodoroaba
Steffi Rades
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany.
Tobias Salge
Affiliation:
Bruker Nano GmbH, Berlin, Germany.
Roland Schmidt
Affiliation:
Hitachi High-Technologies Europe GmbH, Krefeld, Germany.
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 662 - 663
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Buhr, E, Senftleben, N, et al., Meas. Sci. Technol. 20 (2009), p. 413.Google Scholar
[2] Hodoroaba, V-D, Benemann, S, et al., Microsc. Microanal. 18 (Suppl 2) (2012), p. 1750.Google Scholar
[3] Motzkus, C, Macé, T, et al., J. Nanopart. Res. 152013), p. 1919.Google Scholar
[4] Hodoroaba, V-D, Akcakayiran, D, et al., Analyst (2014), in press.Google Scholar
[5] Hodoroaba, V-D, Rades, S, et al., Surf. Interf. Anal (2014), in press.Google Scholar
[6] The research leading to these results has received funding from the European Union’s Seventh Framework Programme (FP7/2007-2013) under grant agreement n° 263147 (NanoValid - Development of reference methods for hazard identification, risk assessment and LCA of engineered nanomaterials).Google Scholar