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Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.

Published online by Cambridge University Press:  31 July 2006

P Thomas ,
J Scott ,
M MacKenzie ,
S McFadzean ,
J Wilbrink  and
A Craven
P Thomas
Affiliation:
Gatan Inc.
J Scott
Affiliation:
University of Glasgow,U.K.
M MacKenzie
Affiliation:
University of Glasgow,U.K.
S McFadzean
Affiliation:
University of Glasgow,U.K.
J Wilbrink
Affiliation:
Gatan Inc.
A Craven
Affiliation:
University of Glasgow,U.K.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1362 - 1363
Copyright
© 2006 Microscopy Society of America