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Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction

Published online by Cambridge University Press:  01 August 2010

MM Nowell ,
JO Carpenter  and
SI Wright
MM Nowell
Affiliation:
EDAX-TSL
JO Carpenter
Affiliation:
EDAX-TSL
SI Wright
Affiliation:
EDAX-TSL

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1352 - 1353
Copyright
Copyright © Microscopy Society of America 2010