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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Published online by Cambridge University Press:  27 August 2014

V. B. Ozdol ,
C. Gammer ,
M.C. Sarahan  and
A. M. Minor
V. B. Ozdol
Affiliation:
.National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, CA, USA and Department of Materials Science and Engineering, University of California, Berkeley, CA, USA
C. Gammer
Affiliation:
.National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, CA, USA and Department of Materials Science and Engineering, University of California, Berkeley, CA, USA
M.C. Sarahan
Affiliation:
Gatan, Inc., Pleasanton, CA, USA
A. M. Minor
Affiliation:
.National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, CA, USA and Department of Materials Science and Engineering, University of California, Berkeley, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1046 - 1047
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Hÿtch, M. J., Snoeck, E. & Kilaas, R. Ultramicroscopy 74, 131 (1998).Google Scholar
[2] Jin, X., et al, Applied Physics Express 6, 015801 (2013).Google Scholar
[3] The authors acknowledge Prof. Xiuguang Jin at Nagoya University for providing the sample and Gatan for use of a K2-IS camera for the experiments.Google Scholar