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Nanoleakage in Hybrid Layer and Acid–Base Resistant Zone at the Adhesive/Dentin Interface

Published online by Cambridge University Press:  09 September 2015

Toru Nikaido ,
Hamid Nurrohman ,
Tomohiro Takagaki ,
Alireza Sadr ,
Shizuko Ichinose  and
Junji Tagami
Toru Nikaido*
Affiliation:
Department of Cariology and Operative Dentistry, Division of Oral Health Sciences, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University (TMDU), 1-5-45, Yushima, Bunkyo-ku, Tokyo 113-8549, Japan
Hamid Nurrohman
Affiliation:
Department of Preventive and Restorative Dental Sciences, University of California, Box 0758, 707 Parnassus Ave., San Francisco, CA 94143-0758, USA
Tomohiro Takagaki
Affiliation:
Department of Cariology and Operative Dentistry, Division of Oral Health Sciences, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University (TMDU), 1-5-45, Yushima, Bunkyo-ku, Tokyo 113-8549, Japan
Alireza Sadr
Affiliation:
Biomimetics Biomaterials Biophotonics & Technology Laboratory, Department of Restorative Dentistry, University of Washington School of Dentistry; 1959 NE Pacific St., Box 357456, Seattle, WA 98195-7456, USA
Shizuko Ichinose
Affiliation:
Instrumental Analysis Research Center, Tokyo Medical and Dental University (TMDU); 1-5-45, Yushima, Bunkyo-ku, Tokyo 113-8549, Japan
Junji Tagami
Affiliation:
Department of Cariology and Operative Dentistry, Division of Oral Health Sciences, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University (TMDU), 1-5-45, Yushima, Bunkyo-ku, Tokyo 113-8549, Japan
*
*Corresponding author.[email protected]
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Abstract

The aim of interfacial nanoleakage evaluation is to gain a better understanding of degradation of the adhesive–dentin interface. The acid–base resistant zone (ABRZ) is recognized at the bonded interface under the hybrid layer (HL) in self-etch adhesive systems after an acid–base challenge. The purpose of this study was to evaluate nanoleakage in HL and ABRZ using three self-etch adhesives; Clearfil SE Bond (SEB), Clearfil SE One (SEO), and G-Bond Plus (GBP). One of the three adhesives was applied on the ground dentin surface and light cured. The specimens were longitudinally divided into two halves. One half remained as the control group. The others were immersed in ammoniacal silver nitrate solution, followed by photo developing solution under fluorescent light. Following this, the specimens were subjected to acid–base challenges with an artificial demineralization solution (pH4.5) and sodium hypochlorite, and prepared in accordance with common procedures for transmission electron microscopy (TEM) examination. The TEM images revealed silver depositions in HL and ABRZ due to nanoleakage in all the adhesives; however, the extent of nanoleakage was material dependent. Funnel-shaped erosion beneath the ABRZ was observed only in the all-in-one adhesive systems; SEO and GBP, but not in the two-step self-etch adhesive system; SEB.

Keywords

dentin bondingself-etch systemTEMHLacid–base resistant zonenanoleakage
Type
Biological Applications
Information
Microscopy and Microanalysis , Volume 21 , Issue 5 , October 2015 , pp. 1271 - 1277
Copyright
© Microscopy Society of America 2015 

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