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Mysterious Field Evaporation Behavior of Hydrogen in Aluminium Based Material Analyzed with Atom Probe Tomography

Published online by Cambridge University Press:  22 July 2022

Loïc Rousseau*
Affiliation:
Groupe Physique des Matériaux, Université de Rouen, Normandie, France
Jean-Baptiste Maillet
Affiliation:
Groupe Physique des Matériaux, Université de Rouen, Normandie, France
Leigh Stephenson
Affiliation:
Max-Planck Institut für Eisenforschung GmbH, D-40237 Düsseldorf, Germany
Benoit Gervais
Affiliation:
CIMAP, Université de Caen, Normandie, France
Baptiste Gault
Affiliation:
Max-Planck Institut für Eisenforschung GmbH, D-40237 Düsseldorf, Germany Department of Material, Royal School of Mines, Imperial College, London, England
François Vurpillot
Affiliation:
Groupe Physique des Matériaux, Université de Rouen, Normandie, France
*
*Corresponding author: [email protected]

Abstract

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Type
Expanding the Limits of Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2022

References

Yoo, S.-H. et al. Origins of the hydrogen signal in atom probe tomography. ArXiv210914981 Cond-Mat (2021).Google Scholar
De Geuser, F. Interprétation et traitement des données de sonde atomique tomographique: Applications à la précipitation dans les Al-Mg-Si. (Université de Rouen, 2005).Google Scholar
Saxey, D. W. Correlated ion analysis and the interpretation of atom probe mass spectra. Ultramicroscopy 111, 473479 (2011).CrossRefGoogle ScholarPubMed
Rousseau, L. et al. Dynamic Effects in Voltage Pulsed Atom Probe. Microsc. Microanal. 114 (2020) doi:10.1017/S1431927620024587.Google ScholarPubMed
Muller, E. W. Field Desorption. Phys. Rev. 102, 618624 (1956).CrossRefGoogle Scholar
Müller, E. W., Nakamura, S., Nishikawa, O. & McLane, S. B. Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory Metals. J. Appl. Phys. 36, 24962503 (1965).CrossRefGoogle Scholar