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My Life as a Microscopist; Two Dual Beams and an Atom Probe

Published online by Cambridge University Press:  05 August 2019

R.L. Martens ,
T.F. Kelly  and
G.B. Thompson
R.L. Martens
Affiliation:
Central Analytical Facility, The University of Alabama, Tuscaloosa, AL 35487
T.F. Kelly
Affiliation:
Steam Instruments, Inc.Madison, WI 53703-5134
G.B. Thompson
Affiliation:
Department of Metallurgical & Materials Engineering, The University of Alabama, Tuscaloosa, AL 35487

Abstract

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Type
Technologists' Forum Roundtable: Technical Careers in Microscopy – For the Love of Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2666 - 2667
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Martens, R.L., Larson, D.J., Kelly, T.F., Cerezo, A., Clifton, P.H, Tabat, N., (2000). “Preparation of 3D Atom Probe Samples of Multilayered Film Structures using a Focused Ion Beam” Microscopy Microanalysis 6(suppl 2): 522-3. (2000)Google Scholar
[2]Larson, D.J, Wissman, B.D., Martens, R.L, Viellieux, R.J., Kelly, T.F, Gribb, T.T., Erskine, H.F., Tabat, N. (2001). “Advances in Atom Probe Specimen Fabrication from Planer Multilayer Thin Film Structures” Microscopy Microanalysis 7: 24-31. (2000)Google Scholar
[3]http://caf.ua.edu/Google Scholar