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My Joy of Research in SEM

Published online by Cambridge University Press:  01 August 2018

Raynald Gauvin
Raynald Gauvin*
Affiliation:
Department of Materials Engineering, McGill University, Montréal, Québec, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 602 - 603
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Joy, D. C., Newbury, D. E. Myklebust, R. L. (1982) J. Microsc-Oxford 128, RP1–RP2.Google Scholar
[2] Gauvin, R. L'Espérance, G. (1992) Journal of Microscopy Vol. 168(pt. 2 pp 153–167.Google Scholar
[3] Gauvin, R., L'Espérance, G. St-Laurent, S. (1992) Scanning Vol. 14, pp 37–48.Google Scholar
[4] Hovington, P., Drouin, D. Gauvin, R. (1997) Scanning Vol.19, pp 1–14.Google Scholar
[5] Brodusch, N., Demers, H. Gauvin, R. (2018) Scanning Electron Microscopy, New Perspectives in Materials Characterization. Springer.Google Scholar