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Multivariate Statistical Analysis of Time of Flight Secondary Ion Mass Spectrometry Raw Data Files

Published online by Cambridge University Press:  05 August 2007

V Smentkowski ,
S Ostrowski ,
M Keenan ,
J Ohlhausen  and
P Kotula
V Smentkowski
Affiliation:
General Electric Global Research
S Ostrowski
Affiliation:
General Electric Global Research
M Keenan
Affiliation:
Sandia National Laboratories
J Ohlhausen
Affiliation:
Sandia National Laboratories
P Kotula
Affiliation:
Sandia National Laboratories
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1356 - 1357
Copyright
© 2007 Microscopy Society of America

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