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Multivariate Statistical Analysis of Series of Diffraction Patterns

Published online by Cambridge University Press:  25 July 2016

P.G. Kotula ,
M.H. Van Benthem ,
H. Ryll ,
M. Simson  and
H. Soltau
P.G. Kotula
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
M.H. Van Benthem
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 482 - 483
Copyright
© Microscopy Society of America 2016 

References

[1] Mott, R.B. & Friel, J.J. (1999). J Microsc-Oxford 193, 2–14.CrossRefGoogle Scholar
[2] Schwartz, A.J., et al.. (2000). Electron Backscatter Diffraction in Materials Science. Kluwer Academic, New York.Google Scholar
[3] Kotula, P.G., Keenan, M.R. & Michael, J.R. (2003). Microsc Microanal 9, 1–17.Google Scholar
[4] Brewer, L.N., Kotula, P.G. & Michael, J.R. (2008). Ultramicroscopy 108, 567–578.Google Scholar
[5] Rauch, E.F. & Veron, M. (2005). Mat.-wiss. u. Werkstofftech 36, 552–556.CrossRefGoogle Scholar
[6] Rauch, E.F., et al. (2010). Z. Kristallogr 225, 103–109.Google Scholar
[7] Ryll, H., et al. (2013). Microscopy and Microanalysis 19, 1160–1161.Google Scholar
[8] Keenan, M.R. (2009). Surf. Int. Anal 41, 79–87.CrossRefGoogle Scholar
[9] Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the US Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar