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Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography

Published online by Cambridge University Press:  22 July 2022

Kejian Qu ,
Hrishikesh Bale ,
Zachary W. Riedel ,
Junehu Park ,
Leilei Yin ,
André Schleife  and
Daniel P. Shoemaker
Kejian Qu
Affiliation:
Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Hrishikesh Bale*
Affiliation:
ZEISS Research Microscopy Solutions, Inc. Dublin CA
Zachary W. Riedel
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Junehu Park
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
Leilei Yin
Affiliation:
Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL
André Schleife
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL National Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL
Daniel P. Shoemaker*
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL
*
*Corresponding author: [email protected]
**Corresponding author: [email protected]

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 278 - 279
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Copyright
Copyright © Microscopy Society of America 2022

References

Latturner, SE, Acc. Chem. Res. 51 (2018), p. 40.CrossRefGoogle Scholar
Stock, SR, Int. Mater. Rev. 53 (2008), p. 129.CrossRefGoogle Scholar
Ludwig, W et al. , J. Appl. Crystallogr. 41 (2008), p. 302–309.CrossRefGoogle Scholar
Ludwig, W et al. , Rev. Sci. Instrum. 80 (2009), p. 033905.Google Scholar