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Monochromated Electron Energy-Loss Spectroscopy of Interfaces in Beam Sensitive Materials

Published online by Cambridge University Press:  01 August 2018

Jessica A. Alexander  and
David W. McComb
Jessica A. Alexander
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1986 - 1987
Copyright
© Microscopy Society of America 2018 

References

[1] Egerton, R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer New York.Google Scholar
[2] Alexander, J.A., et al, J. Mater. Chem. A 4 2016) p. 13636.Google Scholar
[3] Alexander, Jessica A., et al, Ultramicroscopy 180 2017) p. 125.Google Scholar
[4] Funding was provided by an AFRL/DAGSI Ohio-Student Faculty Research Fellowship awarded by the Air Force Laboratory Manufacturing and Materials Directorate, and by The Ohio State University through a Distinguished University Fellowship.Google Scholar