Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-25T01:14:47.350Z Has data issue: false hasContentIssue false

Monitoring Bismuth Ferrite Domain Walls Behavior Under Electric Field With Atomic Resolution By In Situ Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Oana-Andreea Condurache*
Affiliation:
Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, Slovenia Jožef Stefan International Postgraduate School, Ljubljana, Slovenia
Goran Dražić
Affiliation:
Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, Slovenia Jožef Stefan International Postgraduate School, Ljubljana, Slovenia Department of Materials Chemistry, National Institute of Chemistry, Ljubljana, Slovenia
Tadej Rojac
Affiliation:
Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, Slovenia Jožef Stefan International Postgraduate School, Ljubljana, Slovenia
Brahim Dkhil
Affiliation:
Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, Université Paris-Saclay, Paris, France
Andraž Bradeško
Affiliation:
Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, Université Paris-Saclay, Paris, France
Hana Uršič
Affiliation:
Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, Slovenia Jožef Stefan International Postgraduate School, Ljubljana, Slovenia
Andreja Benčan
Affiliation:
Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, Slovenia Jožef Stefan International Postgraduate School, Ljubljana, Slovenia
*
*Corresponding author: [email protected]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Copyright
Copyright © Microscopy Society of America 2022

References

Moore, K., Bangert, U. and Conroy, M, APL Mater. 9 (2021), 020703. https://doi.org/10.1063/5.0035958CrossRefGoogle Scholar
Ignatans, R., Damjanovic, D. and Tileli, V., Phys. Rev. Materials 4 (2020), 104403. https://doi.org/10.1103/PhysRevMaterials.4.104403CrossRefGoogle Scholar
Vogel, A., Sarott, M. F., Campanini, M., Trassin, M. and Rossell, M. D., Materials 14 (2021), 4749. https://doi.org/10.3390/ma14164749CrossRefGoogle Scholar
Jia, C.-L., Jin, L., Wang, D., Mi, S.-B., Alexe, M., Hesse, D., Reichlova, H., Marti, X., Bellaiche, L. and Urban, K. W., Acta Materialia 82 (2015), 356. https://doi.org/10.1016/j.actamat.2014.09.003CrossRefGoogle Scholar
Condurache, O., Drazic, G., Sakamoto, N., Rojac, T. and Bencan, A., J. Appl. Phys. 129 (2021), 054102. https://doi.org/10.1063/5.0034699CrossRefGoogle Scholar
This work was supported by the Slovenian Research Agency (program P2-0105, projects J2-2497, J2-3041 and PR-08978).Google Scholar